Publications

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2024

  • Birgit Achleitner, David Ken Gibbs, Silvia Larisegger, Michael Nelhiebel, and Andreas Limbeck. Employing reduced pressure to analyze challenging elements in LIBS. In 2024 Winter Conference on Plasma Spectrochemistry (WCPS), Tucson, Arizona, January 2024.
  • Birgit Achleitner, Laurie Girault, Silvia Larisegger, Michael Nelhiebel, Patrick Knaack, and Andreas Limbeck. LIBS as a novel tool for the determination of the imidization degree of polyimides. Analytical and Bioanalytical Chemistry, 416(7):1623–1633, February 2024. (doi:10.1007/s00216-024-05163-6)
  • Birgit Achleitner. Advanced analytical approaches to characterize ion mobility and structural changes in polyimide. PhD thesis, Vienna University of Technology, 2024.
  • Avijit Bhattacharya. Application relevant power cycling of next generation SiC MOSFETs. Master’s thesis, Politecnico di Milano, 2024.
  • Keven Brugger and Dorian Kerschbaumer. Speedgoat graphical user interface for visualisation and brakeout PCB. HTL Diploma thesis, HTL Mössignerstraße, 2024.
  • Boris Butej, Dominik Wieland, Dionyz Pogany, Amgad Gharib, Gregor Pobegen, Clemens Ostermaier, and Christian Koller. Evidence-based understanding of lateral hole transport during OFF-state stress completing dynamic GaN-on-Si buffer charging model. physica status solidi (a) – applications and materials science, Early View, May 2024. (doi:10.1002/pssa.202400089)
  • Maximilian W. Feil, Magdalena Weger, Hans Reisinger, Thomas Aichinger, André Kabakow, Dominic Waldhör, Andreas C. Jakowetz, Sven Prigann, Gregor Pobegen, Wolfgang Gustin, Michael Waltl, Michel Bockstedte, and Tibor Grasser. Time-gated optical spectroscopy of field-effect-stimulated recombination via interfacial point defects in fully processed silicon carbide power MOSFETs. Physical Review Applied, 22(2), August 2024. (doi:10.1103/physrevapplied.22.024075)
  • Maximilian W. Feil, Katja Waschneck, Hans Reisinger, Judith Berens, Thomas Aichinger, Sven Prigann, Gregor Pobegen, Paul Salmen, Gerald Rescher, Dominic Waldhoer, Aleksandr Vasilev, Wolfgang Gustin, Michael Waltl, and Tibor Grasser. Gate switching instability in silicon carbide MOSFETs—part i: Experimental. IEEE Transactions on Electron Devices, Early Access, 2024. (doi:10.1109/ted.2024.3397636)
  • Wolfgang Flachberger, Alexander Huber, Cui Charlotte, Brunner Roland, Leitner Silvia, Petersmann Manuel, and Antretter Thomas. The role of mechanical driving forces for segregation phenomena in microelectronic solders. In 43rd Solid Mechanics Conference: SolMech 2024, Wroclaw, Poland, 16-18 September 2024 2024.
  • Vasileios Fotopoulos. Atomistic modelling of defects and impurities in polycrystalline copper. PhD thesis, University College London, 2024.
  • Fabian Froech, Sabine Kubicek, Werner Artner, Michael Nelhiebel, Silvia Larisegger, and Guenter Fafilek. A versatile electrochemical cell for in-situ GI-XRD measurements on lab-scale XRD devices. Journal of Electroanalytical Chemistry, 971:118591, October 2024. (doi:10.1016/j.jelechem.2024.118591)
  • David Ken Gibbs, Silvia Larisegger, Michael Nelhiebel, Johannes Frank, and Andreas Limbeck. Studying the influence of UV radiation on the water uptake behavior of polymer films by LA-ICP-MS. In 2024 Winter Conference on Plasma Spectrochemistry (WCPS), Tucson, Arizona, January 2024.
  • David Ken Gibbs, Silvia Larisegger, Michael Nelhiebel, and Andreas Limbeck. Quantification of deuterium in polymeric materials with LIBS. In 2024 Winter Conference on Plasma Spectrochemistry (WCPS), Tucson, Arizona, January 2024.
  • David Ken Gibbs, Maximilian Podsednik, Patrick Tapler, Maximilian Weiss, Alexander Karl Opitz, Michael Nelhiebel, Charles Derrick Quarles Jr, Silvia Larisegger, and Andreas Limbeck. Improving spatial resolution by reinterpreting dosage for laser-induced breakdown spectroscopy imaging: Conceptualization and limitations. Chemical & Biomedical Imaging, Open Access, July 2024. (doi:10.1021/cbmi.4c00045)
  • Tibor Grasser, Maximilian W. Feil, Katja Waschneck, Hans Reisinger, Judith Berens, Dominic Waldhoer, Aleksandr Vasilev, Michael Waltl, Thomas Aichinger, Michel Bockstedte, Wolfgang Gustin, and Gregor Pobegen. A recombination-enhanced-defect-reaction-based model for the gate switching instability in SiC MOSFETs. In 2024 IEEE International Reliability Physics Symposium (IRPS). IEEE, April 2024. (doi:10.1109/irps48228.2024.10529465)
  • Tibor Grasser, Maximilian W. Feil, Katja Waschneck, Hans Reisinger, Judith Berens, Dominic Waldhoer, Aleksandr Vasilev, Michael Waltl, Thomas Aichinger, Michel Bockstedte, Wolfgang Gustin, and Gregor Pobegen. Gate switching instability in silicon carbide MOSFETs—part ii: Modeling. IEEE Transactions on Electron Devices, Early Access, 2024. (doi:10.1109/ted.2024.3397629)
  • Jakob Hauser. Elektrische Charakterisierung des Ladungseinfangs in der Gate-Region von GaN High-Electron-Mobility Transistoren (HEMTs). Bachelor’s thesis, Graz University of Technology, 2024.
  • Alexander Huber. Mean-field-model development for void formation in SAC305-solder bumps. Master’s thesis, Montanuniversität Leoben, 2024.
  • Ana Maria Jaramillo. Analysis of damage structures in microelectronics using computer vision. Master’s thesis, Carinthia University of Applied Sciences, 2024.
  • Corinna Kofler and Isabell Dicillia-Kovatsch. The power of computer vision: enhancing manufacturing quality control by automated image classification. In WiDS Villach, Villach, AUT, April 2024.
  • Corinna Kofler, Sabrina Strauß, Anja Zernig, Ernesto Lazaro Garcia, Michael Boxleitner, Beatrix Mayr, Isabell Dicillia-Kovatsch, and Claudia Anna Dohr. Carinthia dataset, February 2024. (doi:10.5281/zenodo.10715190)
  • Corinna Kofler, Francisco López de la Rosa, Dominic Zarre, Gianluca Guglielmo, Claudia Anna Dohr, Judith Dohr, Anja Zernig, and Antonio Fernández-Caballero. Recent Advances in Microelectronics Reliability, chapter Automated Classification of Semiconductor Defect Density SEM Images Using Deep Learning, pages 99–116. Springer International Publishing, 2024. (doi:10.1007/978-3-031-59361-1_4)
  • René Lenz. Optimal control with radial force compensation for multiphase permanent magnet synchronous machines under multiple open-circuit faults. phdthesis, Vienna University of Technology, 2024.
  • Katharina Mairhofer, Silvia Larisegger, Annette Foelske, Markus Sauer, Gernot Friedbacher, and Günter Fafilek. New insights into the photoassisted anodic reactions of n-type 4H SiC semiconductors. Monatshefte für Chemie – Chemical Monthly, Open Access, May 2024. (doi:10.1007/s00706-024-03212-5)
  • Sebastian Moser, Michael Reisinger, Tobias Ziegelwanger, Michael Nelhiebel, Jozef Keckes, and Megan J. Cordill. Study of thermo-mechanical fatigue of metallizations using correlative in-situ methodologies. In Nanomechanical Testing in Materials Research and Development IX, Giardini Naxos, Italy, October 2024.
  • Sara Morgante Piano. Disjunctive graph heuristics for semiconductor scheduling applications. Master’s thesis, Alpen-Adria-Universität Klagenfurt, Klagenfurt, 2024.
  • Maximilian Podsednik, Birgit Achleitner, Jakob Willner, Ahmed Bahr, Helmut Riedl, Paul Mayrhofer, Tobias Huber, Silvia Larisegger, Michael Nelhiebel, and Andreas Limbeck. Application of an in-situ LIBS heating stage for material characterization. In 2024 Winter Conference on Plasma Spectrochemistry (WCPS), Tucson, Arizona, January 2024.
  • Maximilian Podsednik, David Ken Gibbs, Maximilian Weiss, Silvia Larisegger, Michael Nelhiebel, and Andreas Limbeck. The impact of dosage on the image quality of laser-induced breakdown spectroscopy. In 2024 Winter Conference on Plasma Spectrochemistry (WCPS), Tucson, Arizona, January 2024.
  • Maximilian Podsednik, Maximilian Weiss, Silvia Larisegger, Michael Nelhiebel, and Andreas Limbeck. The next advancement in online-laser ablation of solids in liquids (LASIL) cell design: the stethoscope cell. In 2024 Winter Conference on Plasma Spectrochemistry (WCPS), Tucson, Arizona, January 2024.
  • Maximilian Podsednik, Florian Fahrnberger, David Ken Gibbs, Birgit Achleitner, Silvia Larisegger, Michael Nelhiebel, Herbert Hutter, and Andreas Limbeck. Quantitative depth profile analysis using short single pulse responses in LA-ICP-Q-MS experiments. Journal of Analytical Atomic Spectrometry, Accepted, 2024. (doi:10.1039/D4JA00082J)
  • Bernhard Ruch, Valeria Padovan, Dionyz Pogany, Clemens Ostermaier, Boris Butej, Christian Koller, and Michael Waltl. Influence of Hole Injection on Associated Recovery Phenomena in GaN-Based GITs Subjected to Hot Electron Trapping. Proceedings of the 2024 Austrochip Workshop on Microelectronics, Accepted, October 2024. (doi:10.1109/Austrochip62761.2024.10716239)
  • Ze F. Scales, Christian Koller, Liverios Lymperakis, Michael Nelhiebel, and Michael Stoeger-Pollach. The role of carbon segregation in the electrical activity of dislocations in carbon doped GaN. Journal of Applied Physics, 136(4), July 2024. (doi:10.1063/5.0213275)
  • Gerald Schaffar, Daniel Tscharnuter, Peter Imrich, and Verena Maier-Kiener. The plasticity of silicon at high temperatures and small length scales. In ECI, Messina, October 2024.
  • Michael Scheiber. On the use of AI to identify issues during wafer test. In European IS-Test Workshop (ITWS), Munich, Germany, September 2024.
  • Niahm Smith, Judith Berens, Gregor Pobegen, Tibor Grasser, and Alexander Shluger. Al–O–Al defect complexes as possible candidates for channel electron mobility reducing trapping centers in 4H-SiC metal–oxide–semiconductor field-effect transistors. Journal of Applied Physics, 136(8), August 2024. (doi:10.1063/5.0213528)
  • Michael Georg Stadt, Silvia Larisegger, Michael Nelhiebel, and Günter Fafilek. Identification of electrochemically formed metal oxides by coupling high-temperature cyclic voltammetry with Raman spectroscopy. Journal of Electroanalytical Chemistry, In Press:118373, May 2024. (doi:10.1016/j.jelechem.2024.118373)
  • Michael Georg Stadt, Silvia Larisegger, Michael Nelhiebel, and Günter Fafilek. In-situ impedance spectroscopy on copper oxide scales under potential controlled oxidation at high temperatures. Electrochimica Acta, 497:144572, September 2024. (doi:10.1016/j.electacta.2024.144572)
  • Daniel Tscharnuter. App for the thermal simulation of power electronics test devices. In COMSOL European Conference, Firenze, October 2024.
  • Michael Verissimo. Design of a sensor fusion network to extend the control of a reliability test system. Master’s thesis, Budapest University of Technology and Economics, 2024.
  • Tong Vivian, Manuel Petersmann, and Vedad Babic. New mtex tools: Trueebsd distortion correction and grain boundary smoothing – case study 1: voids in copper. In MTEX workshop, TUB Freiberg, 04-08 March 2024 2024.
  • Magdalena Weger, Michel Bockstedte, and Gregor Pobegen. Emission of trapped electrons from the 4H-SiC/SiO_2-interface via photon-irradiance at cryogenic temperatures. Defect and Diffusion Forum, 434:61–66, August 2024. (doi:10.4028/p-f0soli)
  • Magdalena Weger, Johannes Kuegler, Michael Nelhiebel, Maximilian Moser, Michel Bockstedte, and Gregor Pobegen. Photon-assisted electron depopulation of 4h-sic/sio2 interface states in n-channel 4h-sic metal-oxide-semiconductor field effect transistors. Journal of Applied Physics, 136:034502, 2024. (doi:10.1063/5.0203724)
  • Jakob Willner, Lukas Brunnbauer, Lars Varain, Patrick Knaack, Michael Nelhiebel, Silvia Larisegger, Günter Fafilek, and Andreas Limbeck. Examining differences in the uptake of corrosive gases in polymer films and its dependence on temperature and relative humidity using a novel procedure combining sample weathering and LA-ICP-MS analysis. Polymer Degradation and Stability, 225:110792, July 2024. (doi:10.1016/j.polymdegradstab.2024.110792)
  • Jakob Willner. Tools for the assessment of polymer film degradation in harsh corrosive environments: Development of a weathering setup and LA-ICP-MS & LIBS methods for advanced chemical characterization. PhD thesis, TU Wien, 2024.
  • Tobias Ziegelwanger, Michael Reisinger, Kurt Matoy, Asma Aicha Medjahed, Jakub Zálešák, Manuel Gruber, Michael Meindlhumer, and Jozef F. Keckes. Backside metallization affects residual stress and bending strength of the recast layer in laser-diced Si. Materials Science in Semiconductor Processing, 181:108579, October 2024. (doi:10.1016/j.mssp.2024.108579)

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